X-ray Fluorescence

X-ray fluorescence (XRF) is a non-destructive method for qualitative and quantitative determination of elements with an atomic weight higher than fluor (Z > 9). The sample is irradiated with highly energetic radiation. On atomic scale these rays will induce emission of an electron. As a result of this, an electron from a higher peel will shift down emitting a characteristic x-ray. The intensity of this ray is proportional to the concentration of the involved element. Samples are accepted either in liquid or solid form. The accuracy of this technique is usually better than 10% relative.