Home » Nanoparticles by SEM and TEM Electron Microscopy Analysis

Why is representative sampling important in electron microscopy?

Only a very small amount of material is examined during electron microscopy. If the selected portion is not representative of the entire sample, the resulting particle size distribution may be misleading. Careful sampling and analysis of a sufficiently large number of nanoparticles are therefore essential.

Does electron microscopy require a dry sample?

Electron microscopy analysis generally requires the sample to be prepared in a dry form. This differs from techniques such as DLS and DCS, which analyse particles dispersed in a liquid. Sample preparation must be carefully controlled to avoid altering the particle structure or causing artificial agglomeration.

Can electron microscopy measure nanoparticle size?

Yes, electron microscopy can be used to measure the size of individual nanoparticles from images. It can also show the particle shape and morphology. To obtain a representative particle size distribution, a sufficient number of particles must be analysed from a properly selected sample.

What is the difference between SEM and TEM analysis of nanoparticles?

Scanning electron microscopy, or SEM, is primarily used to examine the surface structure and morphology of particles. Transmission electron microscopy, or TEM, uses electrons transmitted through a thin sample and can provide detailed information about small particles and their internal structure. The most suitable technique depends on the material and …

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